Showing results: 211 - 225 of 279 items found.
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UTP 5065 -
NOFFZ Computer Technik GmbH
Radar sensors are core elements to realize autonomous driving. The UTP 5065 radar test system from NOFFZ Technologies has a compact vertical design and contains everything needed to allow State-of-the-Art measurement and sensor calibration. The test bench setup and component selection are tuned to get best possible results for highly accurate and cost-efficient testing in production of automotive radar sensors.
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PEM-1000 -
Korima, Inc.
The PEM-1000 emission microscope incorporates the latest technology in real time, high quantum efficiency, mega-pixel CCD detectors in a back-thinned cooled camera. A portable system, the PEM 1000 can interface with all analytical probe stations, ATE (automated test equipment) and bench top configurations for high speed functional testing.
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DST200 -
Rohde & Schwarz GmbH & Co. KG
The R&S®DST200 RF diagnostic chamber is the ideal environment for RF analysis during development. It supports a wide range of radiated test applications for wireless devices and fits on any R&D lab bench, where it can be used at all times during the product design and optimization phase. The R&S®DST200 effectively assists in achieving high first-time pass rates during final type approval, which saves time and money.
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Get Control, Inc.
GCI's Automated Connector Tester is a self-contained test bench providing reliable testing of filtered and non-filtered electrical connectors. The ACT automates the tedious process of testing each pin against all others and shell for DC and AC leakage. For filter connectors, the ACT accurately measures pin-to-shell capacitance. For pins protected by diodes, the ACT provides leakage and breakdown measurements. The ACT also verifies pins which are intentionally shorted to each other or to the shell.
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Eye-BERT Micro LR -
Spectronix
The Eye-BERT Micro LR is a low cost, easy to use test solution offering BER testing at any rate between 6.312 and 125Mbps on either optical or electrical interfaces. Features include: continuously variable bit rate, user programmable pulse generator, internal CDR with retimer mode, bit rate measurement, and recovered clock output. The Unit is supplied with anti-skid bumpers for bench use, and is small enough to be integrated into larger systems for dedicated link verification.
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RealCar Simulation Bench -
Ono Sokki
This system is suitable for transient test of actual vehicle in combination with the real-time model calculation by the measurement/control panel and low inertial motor. By replacing the wheel of the actual vehicle with the tire type bearing, the axle shaft is taken out to the outside of the vehicle and connected to the low inertia motor. It can be reproduced the sliding motion which the chassis dynamometer cannot be realized. Also, since the longitudinal force is not occurred in the vehicle, the vehicle restraint can be simplified and the behavior such as shift shock can be reproduced on the bench.
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2000A -
SCR ELEKTRONIKS
SCR ELEKTRONIKS have developed “TEMPERATURE RISE TEST BENCH FOR MEDIUM VOLTAGE SWITCH BOARDS” to measure rise in temperature at various points as mentioned in standard at junctions. The set-up consists of a True RMS Constant Current Source (to maintain the Current within + / - 1 % of set value with Digital Indication), PC based control system, Temperature data logging on PC, Servo-Controller and other indications. Digital voltmeter Primary Voltage) indicates the position of auto transformer (variac).
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S.E.A. Datentechnik GmbH
The P480-1000 battery test system is a scalable high-performance test system consisting of a central power unit with power supply units and electronic loads and up to four mobile test stations. The test stations contain the necessary measuring technology and the PC terminal with touch screen for operating the test bench. The modular concept, the common use of power supply units and loads as well as the regenerative capability of the loads enables an extremely cost-efficient operation of the entire test system both in the development and production of battery systems. The required power is switched to the respective test station via a specially developed high-performance switching matrix
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ETS-88RF -
Teradyne, Inc.
Targeting the needs of power amplifier (PA) and front-end-module (FEM) semiconductor manufacturers, the ETS-88RF test system is aligned with the test challenges associated with these direct RF radio wave interface components. The precision with which the ETS-88RF can measure high-gain, wideband frequency performance, adjacent channel leakage and power supply efficiency makes this test system the most cost-effective alternative to bench set-ups. Teradyne routinely provides timely updates to a substantial library of RF Standards (such as 802.11xx and 3GPP) targeted for PA and FEM test.
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Quantifi Photonics Inc.
The VOA MATRIQ Series is a MEMS-based variable optical attenuator with fast attenuation speed, low insertion loss and in-built power meter. Its advanced power stabilization function lets you set and maintain the output power stability even when the input power fluctuates.It is available in singlemode, multimode and polarization maintaining fibre types and various wavelengths to suit a wide range of applications.With a stackable, space-saving design and intuitive software controls make it a valued addition to the optical lab or test bench.
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TGR6000 -
Aim-TTi
0MHz to 6000MHz frequency range10Hz setability, ±1ppm frequency stabilityLocking to external frequency standard-110dBm to +7dBm amplitude, 0.1dB stepsFast stepping sweep with dwell times down to 10msList sweep of up to 1000 points of amplitude vs frequencyUser compensation tables for specific test set-upsStorage for 12 generator set-ups and 16 sweep listsCompact half-rack 2U casing uses minimum bench spaceFull remote control through RS232, USB, LAN and GPIBSignificantly lower cost than other 6GHz generators
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DT-JT -
Lisun Electronics Inc.
The machine wills automatic stop positioning after sample reach up to the sated height position. According to the different size to choice the test distance between tests arms, electric pulse width. The release mechanism of machine are flexible and reliable, to ensure the sample without any external influence during the release of instant and free fall way, and make sure it meet sample’s dropping requirements. It is according to GB4757.5-84), GB/T4857.5-92, GB/T2423.5, IEC68-2-27, JISZ0202-87, ISO2248-19, ISO2248-1985(E, ASTMD5276-1998 and ISTA3A. This series drop test bench for measuring the main simulation packages in the transportation, loading and unloading process under drop impact influence, identification package impact strength and packaging design.
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Time Electronics
Each model in our portable test equipment range is designed for accuracy and reliability, providing high performance and ease of use for applications. Products are used in various lab and field applications across industries such as research and development, semiconductor, and process control. For higher range electrical source and measure we have a series of bench multifunction calibrators and multimeters.
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M5615B -
International Microsystems Inc.
The M5615 tester is a 16 Socket Bench top Production and Engineering Tester that supports USB 3.0 Super Speed and USB 2.0 High Speed devices. The tester comes with a built-in PC running a full Linux operating system that tests and copies any USB storage device including USB Hard Drives at super speeds.
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Ohm Loads Powertek Inc.
The DC SERIES load banks are designed for connection to DC Power Supplies , Aircraft Power Converters, Telecom Rectifiers, Batteries, Fuel Cells or any other DC power source. The DC SERIESis ideal for integration into racked test systems or bench - top testing. These standard models are easily configured for other voltage and current ratings.
